J. Comput. Inf. Sci. Eng. Apr 2024, 24(4): 040201
https://doi.org/10.1115/1.4064714
The Editor and Editorial Board of the Journal of Computing and Information Science in Engineering would like to thank all of the reviewers for volunteering their expertise and time reviewing manuscripts in 2023. Serving as reviewers for the journal is a critical service necessary to maintain the quality of our publication and to provide the authors with a valuable peer review of their work. Below is a complete list of reviewers for 2023. We would also like to acknowledge three outstanding Reviewers of the Year.
2023 Reviewers of the Year
Nicole A. Apetre — U.S. Naval Research Laboratory, USA
Shaurya Shriyam — Indian Institute of Technology Delhi, India
Wenhao Yang — Rochester Institute of Technology, USA
The Reviewer of the Year Award is given to reviewers who have made an outstanding contribution to the journal in terms of the quantity, quality, and turnaround time of reviews completed during the past 12 months. The prize includes a Wall Plaque, 50 free downloads from the ASME Digital Collection, and a one-year free subscription to the journal.
List of JCISE Reviewers
D. Allaire
J. Allen
R. Altschaffel
G. Ameta
A. Ammar
Q. An
N. Apetre
M. Austin
S. Baek
S. Balakrishna
D. Baroroh
S. Basir
S. Behdad
A. Behjat
B. Benaissa
W. Bernstein
Y. Bi
A. Birnbaum
A. Biswas
B. Bose
C. Bronkhorst
R. Burla
A. Butler
J. Butterfield
J. Cagan
M. Campbell
M. Carulli
S. Chandrasegaran
Q. Chao
A. Chatterjee
A. Chaudhari
G. Chen
H. Chen
J. Chen
L. Chen
X. Chen
Z. Chen
R. Chintala
D. Chowdhury
C. Chu
E. Cueto
X. Cui
S. Dong
N. Dozio
D. Allaire
J. Allen
R. Altschaffel
G. Ameta
A. Ammar
Q. An
N. Apetre
M. Austin
S. Baek
S. Balakrishna
D. Baroroh
S. Basir
S. Behdad
A. Behjat
B. Benaissa
W. Bernstein
Y. Bi
A. Birnbaum
A. Biswas
B. Bose
C. Bronkhorst
R. Burla
A. Butler
J. Butterfield
J. Cagan
M. Campbell
M. Carulli
S. Chandrasegaran
Q. Chao
A. Chatterjee
A. Chaudhari
G. Chen
H. Chen
J. Chen
L. Chen
X. Chen
Z. Chen
R. Chintala
D. Chowdhury
C. Chu
E. Cueto
X. Cui
S. Dong
N. Dozio
B. Duan
P. Egan
S. Feng
K. Fu
K. Fukami
M. Fürth
A. Garg
D. Gibbons
S. Goetz
N. Govindan
B. Graber
J. Guilleminot
S. Gundupalli
A. Gupta
M. Hossain
S. Hosseini
P. Hu
Y. Hu
Z. Hu
Copyright © 2024 by ASME
A. Iliopoulos
F. Imani
S. Jang
J. Jiao
A. Joneja
A. Jones
P. Kakanuru
P. Kankar
S. Khatir
J. Kim
H. Ko
A. Krishnamurthy
V. Krishnamurthy
M. Kullappan
A. Kumar
N. Kumar
Y. Ledoux
X. Lee
D. Li
J. Li
T. Li
W. Li
Y. Li
Y. Liang
S. Lim
T. Lim
C. Liu
J. Liu
Q. Liu
X. Liu
Z. Liu
F. Lu
Y. Lu
C. Ma
L. Malashkhia
H. Mao
C. Mccomb
J. Meng
F. Milaat
R. Mohanty
M. Mousavi
C. Moya Calderon
D. Mun
V. Narang
P. Nguyen
K. Nguyen Duy
C. Nirala
Y. Pan
J. Panchal
C. Paulsen
U. Persad
B. Pidaparthi
G. Purdy
R. Raffaeli
M. Rahman
G. Rajchakit
P. Ramanan
R. Ranade
B. Ren
S. Rodriguez
J. Rodríguez Arce
S. Rudraraju
V. Sangwan
V. Saseendran
M. Shafae
J. Shin
S. Shriyam
L. Siddharth
B. Song
J. Summers
H. Sun
A. Sundar
K. Suresh
M. Takalloozadeh
T. Thanh Ngoc
Z. Tian
A. Tiwari
A. Tran
A. Trivedi
N. Tsoutos
C. Vallabh
A. Vitali
X. Wang
Y. Wang
Z. Wang
B. Watson
R. Wendrich
M. Wu
Z. Xi
J. Xie
T. Xie
W. Xing
D. Xue
S. Yan
W. Yan
J. Yang
W. Yang
Z. Ye
B. Zhang
G. Zhang
S. Zhang
X. Zhang
Y. Zhang
X. Zhao
Q. Zhou
X. Zhu