ASME

Journal of Computing and Information Science in Engineering

Highlights of 2019 CIE Conference

Share This Post

Guest Editors: Mahesh Mani (Allegheny Science and Technology), Caterina Rizzo (University of Bergamo), and Yan Wang (Georgia Institute of Technology)

This special issue contains a selection of papers from the 39th American Society of Mechanical Engineers (ASME) Computers and Information in Engineering (CIE) Conference that was held in Anaheim, CA, August 18–21, 2019, in conjunction with the International Design Engineering Technical Conferences (IDETC). Nominated by the four technical committees namely Advanced Modeling and Simulation (AMS), Computer Aided Product and Process Development (CAPPD), Systems Engineering, Information and Knowledge Management (SEIKM), and Virtual Environments and Systems (VES) based on the conference paper review results, these papers reflect recent and relevant advancements in these technical areas.

J. Comput. Inf. Sci. Eng. October 2020, Volume 20, Issue 5

Copyright © 2020 by ASME

GO TO ASME DIGITAL COLLECTION

Visit the ASME Digital Collection archives for JCISE

More To Explore

Announcements

Special Issue on Geometric Data Processing and Analysis for Advanced Manufacturing

Geometric information, such as three-dimensional (3D) shapes and network topologies, has been increasingly explored in manufacturing research. For example, characterizing geometric information in 3D-printed parts, in-situ or ex-situ, opens opportunities for defect detection, quality improvement, and product customization. However, geometric data mining remains critically challenging. Geometric information is embedded in complex data structures, such as 3D point clouds, graphs, meshes, voxels, high-dimensional images, and tensors, which possess challenges for analysis due to their high-dimensionality, high-volume, unstructured, multimodality characteristics. Additional challenges stem from compromised data quality (e.g., noisy and incomplete data), the need for registration, etc.

JCISE VIDEOS